Kyselina dusičná ≥70%, CMOS for microelectronic, J.T.Baker®
Dodavatel: Avantor
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Nebezpečí
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9606-03EA
5080
CZK
9606-R
9606-03
9606-33
Kyselina dusičná ≥70%, CMOS for microelectronic, J.T.Baker®
Kyselina dusičná
Vzorec:
HNO₃ MW: 63,01 g/mol Storage Temperature: Ambient |
MDL Number:
MFCD00011349 CAS číslo: 7697-37-2 EINECS: 231-714-2 UN: 2031 ADR: 8,I |
Výsledky specifikačního testu
Assay (HNO₃} | 69.0 - 70.0 % |
Appearance Passes Test | Passes Test |
Color (APHA) | ≤10 |
Residue after Ignition | ≤2 ppm |
Chloride (Cl) | ≤0.08 ppm |
Phosphate (PO₄) | ≤0.1 ppm |
Sulfate (SO₄) | ≤0.2 ppm |
Trace Impurities - Aluminum (Al) | ≤40.0 ppb |
Arsenic and Antimony (as As) | ≤5 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤50.0 ppb |
Trace Impurities - Calcium (Ca) | ≤50.0 ppb |
Trace Impurities - Chromium (Cr) | ≤30.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤20.0 ppb |
Trace Impurities - Gold (Au) | ≤20.0 ppb |
Heavy Metals (as Pb) | ≤100 ppb |
Trace Impurities - Iron (Fe) | ≤40.0 ppb |
Trace Impurities - Lead (Pb) | ≤20.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤20.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | |
Trace Impurities - Niobium (Nb) | |
Trace Impurities - Potassium (K) | ≤50.0 ppb |
Trace Impurities - Silicon (Si) | ≤50.0 ppb |
Trace Impurities - Silver (Ag) | ≤20.0 ppb |
Trace Impurities - Sodium (Na) | ≤150.0 ppb |
Trace Impurities - Strontium (Sr) | ≤30.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count - 0.5 µm and greater | ≤60 par/ml |
Particle Count - 1.0 µm and greater | ≤10 par/ml |
For Microelectronic Use | |
Storage Note: Do not store near Ammonium Hydroxide. White crystals may form around the opening. The crystals can be removed with deionized water. This will not affect the quality of the product in the bottle. |
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